Accurate evaluation of μ-PIXE and μ-XRF spectral data through iterative least squares fitting
K. Janssens; B. Vekemans; F. Adams; P. van Espen; P. Mutsaers
- 作者K. Janssens; B. Vekemans; F. Adams; P. van Espen; P. Mutsaers
- 印刷ISSN0168-583X
- 文件大小696.83KB
- 发表时间1996
- DOI10.1016/0168-583x(95)01211-7
- 页码179-185