Direct determination of Se and As in solid certified reference materials using electrothermal vaporization inductively coupled plasma mass spectrometry

• 作者S. Boonen; F. Vanhaecke; L. Moens; R. Dams
• 卷第51卷
• 期第2期
• 印刷ISSN0584-8547
• 文件大小537.82KB
• 发表时间1996
• DOI10.1016/s0584-8547(99)80004-4
• 页码271-278