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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching of MOS transistors with different layout styles

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching of MOS transistors with different layout styles

Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W.

作者Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W.
文件大小289.70KB
发表时间1996
DOI10.1109/icmts.1996.535615
页码17-18

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