Measurement of AlN/GaN (0001) heterojunction band offsets by x-ray photoemission spectroscopy
- 期刊名称Applied Physics Letters
- 作者Waldrop, J. R.; Grant, R. W.
- 卷第68卷
- 期第20期
- 印刷ISSN0003-6951
- 文件大小286.75KB
- 发表时间1996
- DOI10.1063/1.116355
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