Modeling and testing for stuck faults in pseudo nMOS combinational circuits
- 作者Asad A. Ismaeel; Rakesh Bhatnagar
- 卷第36卷
- 期第5期
- 印刷ISSN0026-2714
- 文件大小529.69KB
- 发表时间1996
- DOI10.1016/0026-2714(95)00125-5
- 页码685-692
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