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Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability

Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability

Christian Landrault; Pascal Nouet

作者Christian Landrault; Pascal Nouet
卷第31卷
印刷ISSN0167-9317
文件大小514.81KB
发表时间1996
DOI10.1016/0167-9317(95)00325-8
页码47-54

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