Junction depth dependence of breakdown in silicon detector diodes

G.A. Beck; A.A. Carter; J.R. Carter; N.M. Greenwood; A.D. Lucas; D.J. Munday; T.W. Pritchard; D. Robinson; C.D. Wilburn; K. Wyllie

作者G.A. Beck; A.A. Carter; J.R. Carter; N.M. Greenwood; A.D. Lucas; D.J. Munday; T.W. Pritchard; D. Robinson; C.D. Wilburn; K. Wyllie
卷第373卷
期第2期
印刷ISSN0168-9002
文件大小393.92KB
发表时间1996
DOI10.1016/0168-9002(96)00015-0
页码223-226

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