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[IEEE Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Montreal, Que., Canada (16-19 June 1996)] Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Electrical aging of extruded dielectric cables: a physical model

[IEEE Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Montreal, Que., Canada (16-19 June 1996)] Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Electrical aging of extruded dielectric cables: a physical model

Crine, J.-P.; Dang, C.; Parpal, J.-L.
  • 作者Crine, J.-P.; Dang, C.; Parpal, J.-L.
  • 卷第2卷
  • 文件大小381.45KB
  • 发表时间1996
  • DOI10.1109/ELINSL.1996.549428
  • 页码646-649
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