[IEEE Comput. Soc. Press Fifth Asian Test Symposium (ATS'96) - Hsinchu, Taiwan (20-22 Nov. 1996)] Proceedings of the Fifth Asian Test Symposium (ATS'96) - Partially parallel scan chain for test length reduction by using retiming technique
- 作者Higami, Y.; Kajihara, S.; Kinoshita, K.
- 文件大小635.76KB
- 发表时间1996
- DOI10.1109/ats.1996.555143
- 页码94-99
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