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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Applied design and analysis of microsystems

Karam, J.M.; Courtois, B.; Poppe, A.; Hofmann, K.; Rencz, M.; Glesner, M.; Szekely, V.

作者Karam, J.M.; Courtois, B.; Poppe, A.; Hofmann, K.; Rencz, M.; Glesner, M.; Szekely, V.
文件大小476.51KB
发表时间1996
DOI10.1109/edtc.1996.494351
页码528-532