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[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - The Neural Engineering of ATE

[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - The Neural Engineering of ATE

Kirkland, L.V.; Wright, R.G.

作者Kirkland, L.V.; Wright, R.G.
文件大小532.36KB
发表时间1996
DOI10.1109/autest.1996.547712
页码292-297

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