[IEEE ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Penang, Malaysia (26-28 Nov. 1996)] ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Gate tunneling current in thin oxide MOSFET
Karim, M.F.; Shaari, S.; Majlis, Y.
- 作者Karim, M.F.; Shaari, S.; Majlis, Y.
- 文件大小412.04KB
- 发表时间1996
- DOI10.1109/smelec.1996.616500
- 页码287-292