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[IEEE IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Dayton, OH, USA (20-23 May 1996)] Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Scanning radiometric imager (SRI)

[IEEE IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Dayton, OH, USA (20-23 May 1996)] Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Scanning radiometric imager (SRI)

Milligan, S.A.; Parker, J.H.; DeLong, M.L.

作者Milligan, S.A.; Parker, J.H.; DeLong, M.L.
卷第2卷
文件大小885.52KB
发表时间1996
DOI10.1109/naecon.1996.517734
页码750-757

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