[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Economics modelling and optimisation of MCM test strategies
Dislis, C.; Jalowiecki, I.P.
- 作者Dislis, C.; Jalowiecki, I.P.
- 文件大小116.38KB
- 发表时间1996
- DOI10.1109/edtc.1996.494379