Transmission electron microscopy study of stacking faults and the associated partial dislocations in pseudomorphic epilayers of ZnSe/GaAs(001)
- 期刊名称Journal of Applied Physics
- 作者Wang, N.; Sou, I. K.; Fung, K. K.
- 卷第80卷
- 期第9期
- 印刷ISSN0021-8979
- 文件大小637.27KB
- 发表时间1996
- DOI10.1063/1.363482
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