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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Advanced Materials for Optical and Precision Structures - <title>Polishability of CERAFORM silicon carbide</title>

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Advanced Materials for Optical and Precision Structures - Polishability of CERAFORM silicon carbide

Ealey, Mark A.; Wellman, John A.; Ealey, Mark A.

作者Ealey, Mark A.; Wellman, John A.; Ealey, Mark A.
卷第2857卷
印刷ISSN0277-786X
文件大小1036.52KB
发表时间1996
DOI10.1117/12.258290
页码78-85

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