Temperature Dependent Line-Shape of the Silicon Dangling Bond EPR-Resonance in Polycrystalline Silicon
- 期刊名称MRS Proceedings
- 作者Nickel, N. H.; Schiff, E. A.
- 卷第452卷
- 电子ISSN1946-4274
- 文件大小385.55KB
- 发表时间1996-1
- DOI10.1557/proc-452-1019
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