SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Integrated structural evaluation: combining ultrasonics and optics
Culshaw, Brian; Pierce, S. Gareth; Philp, Wayne R.; Michie, W. Craig; Gorecki, Christophe
- 作者Culshaw, Brian; Pierce, S. Gareth; Philp, Wayne R.; Michie, W. Craig; Gorecki, Christophe
- 卷第2782卷
- 印刷ISSN0277-786X
- 文件大小546.21KB
- 发表时间1996
- DOI10.1117/12.250736
- 页码120-124