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RHEED intensity oscillations observed during the growth of YSi2 − x on Si(111) substrates

RHEED intensity oscillations observed during the growth of YSi2 − x on Si(111) substrates

A. Daniluk; P. Mazurek; K. Paprocki; P. Mikołajczak

作者A. Daniluk; P. Mazurek; K. Paprocki; P. Mikołajczak
卷第391卷
印刷ISSN0039-6028
文件大小624.03KB
发表时间1997
DOI10.1016/s0039-6028(97)00486-x

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