SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Uzhgorod, Ukraine (Monday 30 September 1996)] Material Science and Material Properties for Infrared Optoelectronics - PbSnSe-on-Si: material and IR-device properties
Zogg, Hans; Fach, Alexander; John, Joachim; Mueller, Peter; Paglino, Carmine; Tiwari, A. N.; Sizov, Fiodor F.; Tetyorkin, Vladimir V.
- 作者Zogg, Hans; Fach, Alexander; John, Joachim; Mueller, Peter; Paglino, Carmine; Tiwari, A. N.; Sizov, Fiodor F.; Tetyorkin, Vladimir V.
- 卷第3182卷
- 印刷ISSN0277-786X
- 文件大小1110.34KB
- 发表时间1997
- DOI10.1117/12.280428
- 页码26-29