Reliability study on bst capacitors for gaas mmic
- 期刊名称Integrated Ferroelectrics
- 作者Noma, Atsushi; Ueda, Daisuke
- 卷第15卷
- 印刷ISSN1058-4587
- 电子ISSN1607-8489
- 文件大小681.56KB
- 发表时间1997-02
- DOI10.1080/10584589708015697
- 页码69-78
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