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[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Fast algorithms for computing electrostatic geometric sensitivities

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Fast algorithms for computing electrostatic geometric sensitivities

Wang, J.; White, J.

作者Wang, J.; White, J.
文件大小213.00KB
发表时间1997
DOI10.1109/sispad.1997.621351
页码121-123

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