[IEEE IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings - Ottawa, Ont., Canada (19-21 May 1997)] IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings - The effective resolution measurement in scope of sine-fit test
- 作者Hejn, K.; Kramarski, L.; Pacut, A.
- 卷第2卷
- 文件大小375.24KB
- 发表时间1997
- DOI10.1109/imtc.1997.612380
- 页码1148-1151
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