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Modeling and testing for stuck faults in BiCMOS combinational circuits

Modeling and testing for stuck faults in BiCMOS combinational circuits

Asad A. Ismaeel; Rakesh Bhatnagar

作者Asad A. Ismaeel; Rakesh Bhatnagar
卷第28卷
印刷ISSN0026-2692
文件大小967.98KB
发表时间1997
DOI10.1016/s0026-2692(97)00008-6
页码663-681

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