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Power-constrained testing for bridging and stuck short faults in CMOS combinational circuits

Power-constrained testing for bridging and stuck short faults in CMOS combinational circuits

Asad A. Ismaeel; Rakesh Bhatnagar

作者Asad A. Ismaeel; Rakesh Bhatnagar
卷第37卷
期第5期
印刷ISSN0026-2714
文件大小525.85KB
发表时间1997
DOI10.1016/s0026-2714(96)00060-1
页码753-761

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