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SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Polarimetry of semiconductor exciton spectra

Nitsovich, Z. B.; Zenkova, C. Y.; Nitsovich, Bohdan M.; Pluta, Maksymilian; Wolinski, Tomasz R.

作者Nitsovich, Z. B.; Zenkova, C. Y.; Nitsovich, Bohdan M.; Pluta, Maksymilian; Wolinski, Tomasz R.
卷第3094卷
印刷ISSN0277-786X
文件大小255.89KB
发表时间1997
DOI10.1117/12.271814
页码184-187