SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Optical Manufacturing and Testing II - Errors caused by nearly parallel optical elements in a laser Fizeau interferometer utilizing strictly coherent imaging
Novak, Erik; Ai, Chiayu; Wyant, James C.; Stahl, H. Philip
- 作者Novak, Erik; Ai, Chiayu; Wyant, James C.; Stahl, H. Philip
- 卷第3134卷
- 印刷ISSN0277-786X
- 文件大小168.19KB
- 发表时间1997
- DOI10.1117/12.295146
- 页码456-460