Unification of Software Reliability Models by Self-Exciting Point Processes
Chen, Yiping; Singpurwalla, Nozer D.
- 期刊名称Advances in Applied Probability
- 作者Chen, Yiping; Singpurwalla, Nozer D.
- 卷第29卷
- 期第2期
- 印刷ISSN0001-8678
- 电子ISSN1475-6064
- 文件大小1785.72KB
- 发表时间1997-06
- DOI10.1017/s0001867800028020
- 页码337-352