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High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures

High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures

Kamino, T.; Sasaki, K.; Saka, H.

期刊名称Microscopy and Microanalysis
作者Kamino, T.; Sasaki, K.; Saka, H.
卷第3卷
期第5期
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小2328.80KB
发表时间1997-09
DOI10.1017/S143192769797029X
页码393-408

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