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Application of resonant X-ray emissions for molecular/electronic structure analysis of boron nitrides

Application of resonant X-ray emissions for molecular/electronic structure analysis of boron nitrides

Y. Muramatsu; H. Kouzuki; T. Kaneyoshi; M. Motoyama; A. Agui; S. Shin; H. Kato; J. Kawai
  • 作者Y. Muramatsu; H. Kouzuki; T. Kaneyoshi; M. Motoyama; A. Agui; S. Shin; H. Kato; J. Kawai
  • 卷第65卷
  • 期第2期
  • 印刷ISSN0947-8396
  • 电子ISSN1432-0630
  • 文件大小170.86KB
  • 发表时间1997-08
  • DOI10.1007/s003390050564
  • 页码191-194
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