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Reduction of the defect density in GaN films using ultra-thin AlN buffer layers on 6H-SiC

Reduction of the defect density in GaN films using ultra-thin AlN buffer layers on 6H-SiC

Satoru Tanaka; Sohachi Iwai; Yoshinobu Aoyagi
  • 作者Satoru Tanaka; Sohachi Iwai; Yoshinobu Aoyagi
  • 卷第170卷
  • 印刷ISSN0022-0248
  • 文件大小960.49KB
  • 发表时间1997
  • DOI10.1016/s0022-0248(96)00611-2
  • 页码329-334
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