Plasma etching and patterning of CVD diamond at <100°C for microelectronics applications
R. Ramesham; W. Welch; W.C. Neely; M.F. Rose; R.F. Askew
- 作者R. Ramesham; W. Welch; W.C. Neely; M.F. Rose; R.F. Askew
- 卷第304卷
- 印刷ISSN0040-6090
- 文件大小833.77KB
- 发表时间1997
- DOI10.1016/s0040-6090(97)00195-8
- 页码245-251