X-ray mask distortions during e-beam patterning
B. Shamoun; M. Sprague; F. Bedford; R. Engelstad; F. Cerrina
- 作者B. Shamoun; M. Sprague; F. Bedford; R. Engelstad; F. Cerrina
- 印刷ISSN0167-9317
- 文件大小283.83KB
- 发表时间1998
- DOI10.1016/s0167-9317(98)00065-3
- 页码283-286