Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy
- 作者Feng Zhang; Xianghuai Liu; S Jin; H Bender; N.Z Lou; Z.H Wilson
- 卷第142卷
- 印刷ISSN0168-583X
- 文件大小515.54KB
- 发表时间1998
- DOI10.1016/s0168-583x(98)00211-0
- 页码61-66