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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique

[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique

Voyiatzis, I.; Paschalis, A.; Nikolos, D.; Halatsis, C.

作者Voyiatzis, I.; Paschalis, A.; Nikolos, D.; Halatsis, C.
文件大小772.93KB
发表时间1998
DOI10.1109/TEST.1998.743284
页码918-925

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