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Studies of epitaxial Fe[sub 0.5]Pd[sub 0.5] thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy

Studies of epitaxial Fe[sub 0.5]Pd[sub 0.5] thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy

Gehanno, V.; Revenant-Brizard, C.; Marty, A.; Gilles, B.
  • 期刊名称Journal of Applied Physics
  • 作者Gehanno, V.; Revenant-Brizard, C.; Marty, A.; Gilles, B.
  • 卷第84卷
  • 期第4期
  • 印刷ISSN0021-8979
  • 文件大小325.39KB
  • 发表时间1998
  • DOI10.1063/1.368298
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