Studies of epitaxial Fe[sub 0.5]Pd[sub 0.5] thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy
Gehanno, V.; Revenant-Brizard, C.; Marty, A.; Gilles, B.
- 期刊名称Journal of Applied Physics
- 作者Gehanno, V.; Revenant-Brizard, C.; Marty, A.; Gilles, B.
- 卷第84卷
- 期第4期
- 印刷ISSN0021-8979
- 文件大小325.39KB
- 发表时间1998
- DOI10.1063/1.368298