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How to Count Patents and Value Intellectual Property:The Uses of Patent Renewal and Application Data

How to Count Patents and Value Intellectual Property:The Uses of Patent Renewal and Application Data

Jean O. Lanjouw, Ariel Pakes and Jonathan Putnam

期刊名称The Journal of Industrial Economics
作者Jean O. Lanjouw, Ariel Pakes and Jonathan Putnam
卷第46卷
期第4期
印刷ISSN0022-1821
电子ISSN1467-6451
文件大小1715.96KB
发表时间1998-12
DOI10.2307/117497
页码405-432

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