[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Status of single-electron memories
- 作者Yano, K.; Ishii, T.; Sano, T.; Mine, T.; Murai, F.; Kure, T.; Seki, K.
- 文件大小545.05KB
- 发表时间1998
- DOI10.1109/iedm.1998.746290
- 页码107-110
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