[IEEE 1998 Fourth International High Temperature Electronics Conference. HITEC - Albuquerque, NM, USA (14-18 June 1998)] 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145) - High temperature ohmic contacts to p-type SiC
- 作者Crofton, J.; Beyer, L.; Hogue, T.; Siergiej, R.R.; Mani, S.; Casady, J.B.; Oder, T.N.; Williams, J.R.; Luckowski, E.D.; Isaacs-Smith, T.; Iyer, V.R.; Mohney, S.E.
- 文件大小409.40KB
- 发表时间1998
- DOI10.1109/hitec.1998.676765
- 页码84-87
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