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Layer-thickness dependence of the conductive properties of Mo/Si multilayers

Elliott, Greg S.; Gromko, Adam D.; VandeVeegaete, Francis; Johnson, Christopher D.; Johnson, David C.

期刊名称Physical Review B
作者Elliott, Greg S.; Gromko, Adam D.; VandeVeegaete, Francis; Johnson, Christopher D.; Johnson, David C.
卷第58卷
期第13期
印刷ISSN0163-1829
电子ISSN1095-3795
文件大小118.70KB
发表时间1998-10-1
DOI10.1103/PhysRevB.58.8805
页码8805-8811