[IEEE ASDAM '98. Conference Proceedings. Second International Conference on Advances Semiconductor Devices and Microsystems - Smolenice Castle, Slovakia (5-7 Oct. 1998)] ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172) - 2d-modeling of exclusion effect in the base of semiconductor device
Malyutenko, V.; Borblik, V.; Klimov, A.
- 作者Malyutenko, V.; Borblik, V.; Klimov, A.
- 文件大小342.77KB
- 发表时间1998
- DOI10.1109/asdam.1998.730198
- 页码199-202