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[IEEE 1998 Fourth International High Temperature Electronics Conference. HITEC - Albuquerque, NM, USA (14-18 June 1998)] 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145) - Thermally stable ohmic contacts to 6H- and 4H- p-type SiC

[IEEE 1998 Fourth International High Temperature Electronics Conference. HITEC - Albuquerque, NM, USA (14-18 June 1998)] 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145) - Thermally stable ohmic contacts to 6H- and 4H- p-type SiC

Liu, S.; Scofield, J.

作者Liu, S.; Scofield, J.
文件大小359.95KB
发表时间1998
DOI10.1109/hitec.1998.676766
页码88-92

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