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Cathodoluminescence Microscopy of Semiconductor Devices Using a Novel Detector with High Collection and Backscattered Electron Rejection Efficiency

Cathodoluminescence Microscopy of Semiconductor Devices Using a Novel Detector with High Collection and Backscattered Electron Rejection Efficiency

Phang, Jacob C.H.; Chan, Daniel S.H.; Chim, W.K.; Liu, Yan Yi; Liu, X.
  • 期刊名称Solid State Phenomena
  • 作者Phang, Jacob C.H.; Chan, Daniel S.H.; Chim, W.K.; Liu, Yan Yi; Liu, X.
  • 电子ISSN1662-9779
  • 文件大小702.71KB
  • 发表时间1998
  • DOI10.4028/www.scientific.net/SSP.63-64.159
  • 页码159-170
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