Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects

• 作者V. Petrescu; A.J. Mouthaan; W. Schoenmaker; C. Salm
• 卷第38卷
• 印刷ISSN0026-2714
• 文件大小243.26KB
• 发表时间1998
• DOI10.1016/s0026-2714(98)00105-x
• 页码1047-1050