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An experiment in estimating reliability growth under both representative and directed testing

An experiment in estimating reliability growth under both representative and directed testing

Mitchell, Brian; Zeil, Steven J.
  • 期刊名称ACM SIGSOFT Software Engineering Notes
  • 作者Mitchell, Brian; Zeil, Steven J.
  • 卷第23卷
  • 期第2期
  • 印刷ISSN0163-5948
  • 文件大小792.10KB
  • 发表时间1998-03-01
  • DOI10.1145/271775.271784
  • 页码32-41
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