发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies

Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies

Li, D.; Free, C.E.; Pitt, K.E.G.; Barnwell, P.G.

期刊名称Electronics Letters
作者Li, D.; Free, C.E.; Pitt, K.E.G.; Barnwell, P.G.
卷第34卷
期第21期
印刷ISSN0013-5194
文件大小98.32KB
发表时间1998
DOI10.1049/el:19981392

← 返回【学霸图书馆】主页