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Lenses for Electron Microscopy and Microanalysis: Shadowgraph Method of Determining Focal Properties and Aberration Coefficients

Lenses for Electron Microscopy and Microanalysis: Shadowgraph Method of Determining Focal Properties and Aberration Coefficients

Rempfer, Gf; Fyfield, Ms; Griffith, Oh

期刊名称Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
作者Rempfer, Gf; Fyfield, Ms; Griffith, Oh
卷第4卷
期第1期
文件大小2232.45KB
发表时间1998
DOI10.0000/PMID9524144
页码34-49

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