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AIP Conference Proceedings [AIP The eighth beam instrumentation workshop - Stanford, California (USA) (4-7 May 1998)]  - Development of nanometer resolution C-band radio frequency beam position monitors in the final focus test-beam

AIP Conference Proceedings [AIP The eighth beam instrumentation workshop - Stanford, California (USA) (4-7 May 1998)] - Development of nanometer resolution C-band radio frequency beam position monitors in the final focus test-beam

Mazaheri, G.; Slaton, T.; Shintake, T.
  • 作者Mazaheri, G.; Slaton, T.; Shintake, T.
  • 印刷ISSN0094-243X
  • 文件大小54.80KB
  • 发表时间1998
  • DOI10.1063/1.57021
  • 页码394-394
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