AIP Conference Proceedings [AIP The eighth beam instrumentation workshop - Stanford, California (USA) (4-7 May 1998)] - Development of nanometer resolution C-band radio frequency beam position monitors in the final focus test-beam
Mazaheri, G.; Slaton, T.; Shintake, T.
- 作者Mazaheri, G.; Slaton, T.; Shintake, T.
- 印刷ISSN0094-243X
- 文件大小54.80KB
- 发表时间1998
- DOI10.1063/1.57021
- 页码394-394