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[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Electromigration failures under bidirectional current stress

[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Electromigration failures under bidirectional current stress

Tao, Jiang; Cheung, Nathan W.; Hu, Chenming

作者Tao, Jiang; Cheung, Nathan W.; Hu, Chenming
文件大小774.84KB
发表时间1998
DOI10.1063/1.54686
页码201-211

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