Degradation mechanism of GaAs MESFETs

Jae Kyoung Mun; Jong-Lam Lee; Haecheon Kim; Byung-Taek Lee; Jae Jin Lee; Kwang-Eui Pyun

作者Jae Kyoung Mun; Jong-Lam Lee; Haecheon Kim; Byung-Taek Lee; Jae Jin Lee; Kwang-Eui Pyun
卷第38卷
期第1期
印刷ISSN0026-2714
文件大小298.93KB
发表时间1998
DOI10.1016/s0026-2714(97)00067-x
页码171-178

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